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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Electro Fatigue Testing Machine
EPS Series
Jinan Testing Equipment IE Corporation
EPS series Electro Fatigue testing machine are fast acting table-top testers ideally suitable for performing static and dynamic fatigue tests on a variety of materials and components. These electro-dynamic machines use a linear electric motor with an adjustable upper cross-head of a stiff dual column frame. The electro-dynamic actuator is connected to single phase power, which resulting in a clean low maintenance solution. With dynamic force capacities, the Electro Fatigue testing machines are used to evaluate the mechanical properties of biologic materials, composites, orthopedic fixation devices, prostheses, spinal constructs, stents, dental implants, elastomeric materials and others.
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EMC Testers
The KES7000 System is a conductive immunity test system that is fully compliant with ISO7637-2 and ISO7637-3, international standards for EMC testing required for automotive electronic components. This system consists of the KES7700 Series Transient Surge Tester, KES7400A Series Voltage variation simulator and KES7100 application software dedicated to the KES7000 system. This product configuration supports JASO standards and the special test requirements of car manufacturers with options or custom orders.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Conductive Footwear Tester
SLTM-1
SLTM-1 Conductive Footwear Tester checks conductive footwear automatically. The SLTM-1 Conductive Footwear Tester automatically and accurately measures the exact amount of resistance in conductive footwear and body grounding devices, ensuring a static control environment. It is ideal for dangerous, potentially explosive areas or areas in the electronic industry where static can destroy sensitive components. Stand on the foot plates and the unit’s direct-reading dial with graduated, color-coded scale indicates the exact amount of resistance. Shipped complete and ready to operate. Has 8 feet of 18-3 type SJ power cord that plugs into any grounded 120-volt AC power source. This unit measures 17 x 12 inches and weighs less than 6 1/2 lbs. All conductive footwear and body grounding devices, such as LEGSTATS, must be worn in pairs. SLTM-1 passes conductive footwear with resistance less than 2.5 MEG Ohm.
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Package Test Loadboards/DIB
DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.
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Low Voltage Test & Measurement
Low voltage testing is able to catch errors such as shorts and opens by applying current to a wire and measuring the voltage. The wire will have a current affected by several factors including resistance and components. If the wire is connected correctly, the test will read low resistance. That means current is flowing through the wire as expected and reaching the required connections. If the tester reads high resistance it means something is impeding the current from reaching its destination. This could be caused by a number of causes.
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Advanced Primary Injection Test Set
PI-2500
The PI-2500 is a versatile and technologically advanced primary injection tester capable of testing circuit breakers up to 2000 amperes frame size. It incorporates a low-impedance output transformer with dual secondaries to provide optimal impedance matching to a wide range of breaker sizes. High-capacity internal fan cooling allows maximum utilization of the output transformer and faster recovery after overload conditions. It is housed in a rugged aluminum frame enclosure with removable sides allowing easy access to all internal components to facilitate ease of service and maintenance. The output of the test set is controlled by means of a proven SCR controller. This provides precise initial phase angle control to reduce DC offset for inductive loads and more consistent pulse currents.
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Fuel Hose Assembly Tester - Basic, USAF
9901-10FHT
The basic fuel hose assembly tester is utilized by those users who do not require the complete 9201A test system which includes all test adapters and components required by U.S. Air Force PD 89MMI638. The 9901-10FHT however includes the identical test pump, manifold and controls and with larger valves, ports and fittings for increased fluid flow, is designed for the identical mission of testing fuel hose assemblies. Maximum pressure is 1000 psi allowing better control resolution at lower test pressures.
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Small Drop Test System
KRD41 series
KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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Gas Filled Hv Test Transformer
YDQW-50KVA/250KV
Wuhan Sangao Electrical Test Installations Limit Co.
SF6 gas -filled testing transformers are especially designed for GIS in the factory and on-site test, and for testing all GIS switchgears and GIS components such as insulators, insulating tension pole, GIS voltage transformer and so on, the PD test can be performed under the general environment because of the merits of encapsulation, the PD level of our equipment can be lee than 3pC, and it can be added a HV bushing to perform the withstand voltage test at the same time.Small and compact dimensions resulting in minimum space requirements. Light-wight components. Rugged construction to withstand long transportation stresses. Direct flanging to the test object. High safety for tester because of encapsulation of all HV parts. Large range of application in conjunction with HV bushing for withstand voltage test. Built-in HV measuring capacitor and coupling capacitor. Built-in HV disconnecting switch to separate multipath test object connector to ensure the safety of HV testing.
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Gas-Filled Hv Testing Transformer
GTU-300KVA/600KV
Wuhan Sangao Electrical Test Installations Limit Co.
SF6 gas -filled testing transformers are especially designed for GIS in the factory and on-site test, and for testing all GIS switchgears and GIS components such as insulators, insulating tension pole, GIS voltage transformer and so on, the PD test can be performed under the general environment because of the merits of encapsulation, the PD level of our equipment can be lee than 3pC, and it can be added a HV bushing to perform the withstand voltage test at the same time. Small and compact dimensions resulting in minimum space requirements. Light-wight components. Rugged construction to withstand long transportation stresses. Direct flanging to the test object. High safety for tester because of encapsulation of all HV parts. Large range of application in conjunction with HV bushing for withstand voltage test. Built-in HV measuring capacitor and coupling capacitor. Built-in HV disconnecting switch to separate multipath test object connector to ensure the safety of HV testing.
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Inflatable High Voltage Testing Transformer
GTU-250KVA/500KV
Wuhan Sangao Electrical Test Installations Limit Co.
SF6 gas -filled testing transformers are especially designed for GIS in the factory and on-site test, and for testing all GIS switchgears and GIS components such as insulators, insulating tension pole, GIS voltage transformer and so on, the PD test can be performed under the general environment because of the merits of encapsulation, the PD level of our equipment can be lee than 3pC, and it can be added a HV bushing to perform the withstand voltage test at the same time.Small and compact dimensions resulting in minimum space requirements. Light-wight components. Rugged construction to withstand long transportation stresses. Direct flanging to the test object. High safety for tester because of encapsulation of all HV parts. Large range of application in conjunction with HV bushing for withstand voltage test. Built-in HV measuring capacitor and coupling capacitor. Built-in HV disconnecting switch to separate multipath test object connector to ensure the safety of HV testing.
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Vector Signal Generator
R&S®SMW200A
Performance and functionality requirements vary depending on test setup and application. The R&S®SMW200A is unrivaled in mastering this challenge and sets new standards for signal generators. When developing and verifying any type of DUT, including component, module and complete base stations – the R&S®SMW200A always easily generates the appropriate test signals with top performance. The flexible modular design of the R&S®SMW200A can be equipped with the exact options required for specific applications. Any configuration is possible, from a classic single-path vector signal generator to a multichannel MIMO receiver tester.
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Digital LOOP/PSC/LOAD Tester
2811 LP
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Radio Vector Tester
Wuhan Sunma Technology Co., Ltd.
Radio & Vector Network Analyzer adopts the advanced digital and RF combination design technology, fundamental wave frequency mixing technology, digital IF processing technology, intelligent power management technology, etc. It comes with features of high precision, small size, light weight, battery power, can measure SWR, Return Loss, Cable Loss, Impedance, DTF, etc, is used to the field test of cable, feeder, and the reflection parameters test of RF components in science and teaching. SunmaFiber provide all kinds of CATV meters, such as Signal Level Meter, QAM Analyzer, Spectrum Analyzer, DVB/DVC/DVT Analyzer and other TV testers.
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Automotive Radar Testers
Rohde & Schwarz provides automotive manufacturers, components suppliers and test houses with innovative, cutting-edge solutions which bring realistic test scenarios from the road to the lab and production line.Our range of solutions include a signal generator-based target simulator, a radome & bumper tester and an anechoic automotive radar test chamber allowing for over-the-air (OTA) testing. These solutions are at the heart of the development of advanced driver assistance systems (ADAS) with its safety-critical features such as emergency braking. Using T&M solutions by Rohde & Schwarz enables a thorough testing of chipsets, sensors and modules at each phase from development and conformance to production.
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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OTDR Tester
M-OTDR-502
Fuzhou Metricu Technology Co Ltd
Optical Time Domain Reflectometer Wavelength 1310 / 1550nm, max test range 150KM, Dynamic range 28 / 26dB, SOR standard data saving, create PDF/EXCEL format report, stable laser source, support CW/270/330/1000/2000Hz, Test fiber's length, loss, attenuation parameters and event map, locate connection point/fusion point, Automatic analysis of various linkers/fusion points, easy analyze of various events,Support saving curves number ≥30000pcs, loss test, detect the optical or optical components loss value, etc. Test IP camera, optical power meter, visual fault locator, RJ45 cable TDR test, cable tester, cable tracer, etc.
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Vibration Unit Tester
BK2020B
We developed the BK2020B as an upgrade to our BK2020 to test the electrical specifications (RPM, current, drop pulse, start up voltage) of your cylindrical or coin type vibration units. You can also test vibration level, noise, isolation resistance, and the DC resistance. The DUT power supply and all measurement components are self contained, so external devices aren't needed and the tester uses DSP, making it capable of fast, highly accurate and reliable measurements. The BK2020B is very versatile. It can be set up as a stand alone machine, or used with a PC and software for access to more information, and to save the data for analysis. Either version is great on the product line but you may also use it for QA, QC and development.
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12V Automatic Battery and 12/24V Electrical System Analyzer
6044
• Easy-to-read LED voltmeter and ammeter• 500 amp safety clamps with “Flexi-Spring” and patented side terminal adapters• Separate 6 ft. high impedance test leads with alligator clips for tight spots• Cart / Printer can be purchased separately – Cart Model 6038C, Printer Model 6041• Automated testing of Batteries, Alternators, & Starters• Max/Min of Current and Voltage• Microprocessor based control board protected from reverse connections• Testing of 12V and 24V electrical systems• Test all types of batteries • Ideal for testing remotely mounted batteries accurately• Automated 500A variable load tester• INCLUDES: Model 6043 1000 Amp AC/DC Inductive Amp Clamp for checking starter draw or parasitic drain test, also can be used with conventional multi-meters• Made in USA of US and Global Components
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Combination Board Tester
ATE QT2256-640 PXI
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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12V 0-500 Amp Carbon Pile Battery Load Tester and 12/24V Electrical Systems Tester
6042
• Test batteries up to 1000 CCA• Interprets data from the charging/starting system on easy-to-read LCD displays• Shows positive and negative amps for easy diagnosis of current leakage problems• 0-500 Amp variable carbon pile load tester• Unique curved carbon discs ensure maximum contact, fewer hot spots, smoother operation and longer life• Heavy-duty single extruded leads for testing up to 15 feet apart• Test electrical systems on 12/24 Volt systems• Test all battery types• Ideal for testing remotely mounted batteries accurately• INCLUDES: Model 6043 1000 Amp AC/DC Inductive Amp Clamp for checking starter draw or parasitic drain test, also can be used with conventional multi-meters; heavy duty, two wheel tilt-back cart with 8” wheels and 2 trays.• Made in USA of US and Global Components
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Steam Aging Tester
Wewon Environmental Chambers Co, Ltd.
These steam aging chamber applied for the testing of sealing property for multi-layer circuit board, IC sealing package, LCD screen, LED, semi-conductor, magnetic materials, NdFeB, rare earths and magnet iron, in which the resistance to pressure and air tightness for above mentioned products can be tested out. ● Overall of the steam aging tester made of stainless steel SUS # 304HL, simple operation settings. Microcomputer digital LED control with time planning function , the maximum set 9,990 Mins. ● Parts, connectors, passive components , semiconductors oxidation test pin high temperature and humidity. ● Metal pin soldering test accelerated aging test. Multiple overtemperature protection / water cut heating and other safety devices. ● The touch- PID + SSR temperature controller, timer function while a time , set the 9990 maximum fractional unlimited.